Wolfspeed, Inc.
System and process for implementing accelerated test conditions for high voltage lifetime evaluation of semiconductor power devices

Abstract:

A process and system for testing includes: arranging devices in a temperature-controlled environment; applying a negative gate bias voltage (Vgs) to the devices; applying a drain voltage (Vds) to the devices; measuring currents and/or voltages of the devices to generate device test data; determining a failure of one or more of the devices based on the device test data generated from the device currents and/or the voltages to generate failure data; and outputting the failure data for the of devices.