Teradyne, Inc.
FUNCTIONAL TESTING WITH INLINE PARAMETRIC TESTING

Abstract:

An example test system includes a circuit to sample a signal that is repetitive in cycles to obtain data; a processor configured to generate an eye diagram based on the data, where the eye diagram represents parametric information about the signal; and a functional test circuit to receive the signal and to perform one or more functional tests on the signal. The test systems is configured to receive the signal from a unit under test and to allow the signal to pass to the functional test circuit inline without changing at least part of the signal.