Xilinx, Inc.
On-die receiver coupling capacitance testing

Abstract:

A method for testing on-die capacitors is provided. The method comprises transmitting, during a first time period, a first modulated testing signal from a first transmitter port of a transmitter to a first receiver port of a receiver along a first path of a differential signal, the first receiver port connected to a first on-die capacitor in the receiver along the first path; driving, during the first time period, a constant voltage on a second transmitter port of the transmitter to a second receiver port of the receiver along a second path of the differential signal comprising a second on-die capacitor; and determining whether the first on-die capacitor is functional, based on the first modulated testing signal.