Bombardier Inc.
Apparatus and methods for non-destructive inspection using microwave microscopy

Abstract:

Methods and apparatus for non-destructive inspection using microwave microscopy are disclosed. In one embodiment, a method for inspecting an electrically-conductive mesh in a composite component using microwave microscopy comprises generating radio-frequency electromagnetic radiation using a microwave microscopy probe disposed adjacent the composite component so that the radio-frequency electromagnetic radiation interacts with the electrically-conductive mesh in the composite component, and, detecting a characteristic associated with the microwave microscopy probe. The detected characteristic is indicative of a condition of the electrically-conductive mesh.