Texas Instruments Incorporated
Antenna-free receiver bit error rate testing

Abstract:

A test system and interface circuitry for antenna-free bit error rate testing of an electronic device under test, including a pulse shaping circuit with a pulse shaping filter circuit to pulse shape a modulating signal before amplitude modulation with a carrier signal, and the amplitude modulated signal is coupled directly or via a transformer and a socket to the device under test without antennas to facilitate automated device testing with simple reconfiguration of signal generators for different device type. A method includes filtering a square wave modulating signal to create a pulse shaped modulating signal, amplitude modulating a carrier signal with the pulse shaped modulating signal to create an amplitude modulated signal, providing the amplitude modulated signal to the socket, and evaluating a bit error rate of the DUT according to receive data from the DUT and according to the BER test transmit data.