Texas Instruments Incorporated
Methods for bump planarity control
Last updated:
Abstract:
A method for manufacturing an integrated circuit package includes depositing a first layer of metal at a location of a first metal post that is for connecting an IC die to an external circuit. The method also includes depositing a second layer of metal at the location of the first metal post, and a first layer of metal at a location of a second metal post that is for connecting the IC die to an external circuit.
Status:
Grant
Type:
Utility
Filling date:
28 Dec 2017
Issue date:
12 Oct 2021