Texas Instruments Incorporated
Methods for bump planarity control

Last updated:

Abstract:

A method for manufacturing an integrated circuit package includes depositing a first layer of metal at a location of a first metal post that is for connecting an IC die to an external circuit. The method also includes depositing a second layer of metal at the location of the first metal post, and a first layer of metal at a location of a second metal post that is for connecting the IC die to an external circuit.

Status:
Grant
Type:

Utility

Filling date:

28 Dec 2017

Issue date:

12 Oct 2021