Texas Instruments Incorporated
False path timing exception handler circuit

Abstract:

A method that includes disabling circuit paths in a circuit under test during transition fault testing (TFT) of valid timing paths of the circuit under test. The method then tests the circuit paths at slower clock speeds than the clock speed of the valid timing paths during TFT of the circuit paths. Finally, the method tests the circuit paths and the valid timing paths to facilitate testing of the circuit under test.