Texas Instruments Incorporated
Calibration of camera and projector

Abstract:

Described examples include a system including a projector configured to project a test pattern image, the test pattern image having at least two elements; a camera configured to capture the test pattern image; and a controller coupled to the projector and to the camera. The controller is configured to obtain a first calibration matrix between the projector and the camera for the at least two elements; determine at least two epipolar lines based on the first calibration matrix and the test pattern image; determine a cost function based on the at least two epipolar lines and the at least two elements in the test pattern image as captured by the camera; and determine a second calibration matrix responsive to the cost function, wherein at least one of a camera position of the camera or a projector position of the projector is adjusted responsive to the second calibration matrix.