Texas Instruments Incorporated
HIGH VOLTAGE ISOLATED MICROELECTRONIC DEVICE

Last updated:

Abstract:

A method forms a first voltage node of a high voltage component of a microelectronic device. The method also forms a plurality of dielectric layers. The method also forms a second voltage node of the high voltage component of the microelectronic device in a fourth position such that the plurality of dielectric layers is between the first voltage node and the second voltage node. During the forming a second voltage node step, a portion of a third layer in the plurality of dielectric layers, in a region outwardly positioned relative to the second voltage node, is removed to expose the second layer, in the plurality of dielectric layers, in the region.

Status:
Application
Type:

Utility

Filling date:

30 Dec 2020

Issue date:

30 Jun 2022