Texas Instruments Incorporated
DROOP COMPENSATION FOR DEVICE UNDER TEST SPECTROSCOPY

Abstract:

A method includes determining a droop component of a measured parameter of a device under test (DUT). The measured parameter is responsive to an excitation signal having a frequency component, and the droop component is determined responsive to a first value of the parameter at a first time and a second value of the parameter at a second time. The parameter at the first time has a first phase value, and the parameter at the second time has a second phase value. The first phase value is equal to the second phase value. The method also includes correcting a frequency domain representation of the parameter by applying the droop component at a frequency of the representation of the parameter corresponding to the frequency component of the excitation signal.