Texas Instruments Incorporated
Mold Heel Crack Problem Reduction

Last updated:

Abstract:

A semiconductor package is provided which addresses problems of mold cap heel cracking. The package may made by using a cavity die and a gate insertion tool. The gate insertion tool, which fits into the cavity die, has an elongated body and includes a nozzle head with an edge which is contoured in relation to a mold cap formed on a substrate. The edge defines a curved border, for the mold cap, from a plane above the substrate to a plane lying on the substrate. The nozzle head includes a slot, for admitting a cull runner tip, centered on an axis of the elongated body.

Status:
Application
Type:

Utility

Filling date:

14 Aug 2019

Issue date:

18 Feb 2021