Texas Instruments Incorporated
Mold Heel Crack Problem Reduction
Last updated:
Abstract:
A semiconductor package is provided which addresses problems of mold cap heel cracking. The package may made by using a cavity die and a gate insertion tool. The gate insertion tool, which fits into the cavity die, has an elongated body and includes a nozzle head with an edge which is contoured in relation to a mold cap formed on a substrate. The edge defines a curved border, for the mold cap, from a plane above the substrate to a plane lying on the substrate. The nozzle head includes a slot, for admitting a cull runner tip, centered on an axis of the elongated body.
Status:
Application
Type:
Utility
Filling date:
14 Aug 2019
Issue date:
18 Feb 2021