Texas Instruments Incorporated
SCAN TEST CONTROL DECODER WITH STORAGE ELEMENTS FOR USE WITHIN INTEGRATED CIRCUIT (IC) DEVICES HAVING LIMITED TEST INTERFACE

Abstract:

An integrated circuit (IC) includes logic components and a scan test circuit coupled to the logic components. The IC also includes a scan input pin coupled to the scan test circuit. The IC also includes a scan input/output pin coupled to the scan test circuit. The scan test circuit includes a decoder coupled to at least one of the scan input pin and the scan input/output pin. The decoder includes storage elements configured to store different scan control signals and to output at least one of the different scan control signals in response to a master control signal.