Texas Instruments Incorporated
Systems, methods, and apparatus to detect address faults

Abstract:

Methods, apparatus, systems and articles of manufacture are disclosed for safety mechanisms to actively detect address faults. An example system includes a first parity generator, a second parity generator, and a parity checker. The first parity generator is to generate a first parity based on a first address information. The first address information corresponds to a desired location to store data in a memory storage array. The second parity generator is to generate a second parity based on a second address information. The second address information corresponding to an actual location where the data is stored in the memory storage array. The parity checker is to compare the first parity and the second parity to detect a fault.