Texas Instruments Incorporated
Structured light depth imaging under various lighting conditions

Abstract:

A method of image processing in a structured light imaging system is provided that includes receiving a captured image of a scene, wherein the captured image is captured by a camera of a projector-camera pair, and wherein the captured image includes a binary pattern projected into the scene by the projector, applying a filter to the rectified captured image to generate a local threshold image, wherein the local threshold image includes a local threshold value for each pixel in the rectified captured image, and extracting a binary image from the rectified captured image wherein a value of each location in the binary image is determined based on a comparison of a value of a pixel in a corresponding location in the rectified captured image to a local threshold value in a corresponding location in the local threshold image.