Applied Materials, Inc.
Methods And Apparatus For Low Temperature Silicon Nitride Films
Last updated:
Abstract:
Processing methods for forming a silicon nitride film comprising exposing a metal surface to a silicon precursor, a nitrogen-containing reactant and a hydrogen-containing plasma at a temperature less than or equal to about 250.degree. C. to form a silicon nitride film with a low etch rate without damaging the metal surface.
Status:
Application
Type:
Utility
Filling date:
10 May 2021
Issue date:
26 Aug 2021