Applied Materials, Inc.
Methods And Apparatus For Low Temperature Silicon Nitride Films

Last updated:

Abstract:

Processing methods for forming a silicon nitride film comprising exposing a metal surface to a silicon precursor, a nitrogen-containing reactant and a hydrogen-containing plasma at a temperature less than or equal to about 250.degree. C. to form a silicon nitride film with a low etch rate without damaging the metal surface.

Status:
Application
Type:

Utility

Filling date:

10 May 2021

Issue date:

26 Aug 2021