Applied Materials, Inc.
ENHANCED SPATIAL ALD OF METALS THROUGH CONTROLLED PRECURSOR MIXING

Last updated:

Abstract:

Methods of depositing a film by atomic layer deposition are described. The methods comprise exposing a substrate surface to a first process condition comprising a first reactive gas and a second reactive gas and exposing the substrate surface to a second process condition comprising the second reactive gas. The first process condition comprises less than a full amount of the second reactive gas for a CVD process.

Status:
Application
Type:

Utility

Filling date:

14 Jun 2021

Issue date:

30 Sep 2021