Applied Materials, Inc.
Diffusion barrier layer
Last updated:
Abstract:
A method of forming an electronic device is disclosed. The method comprises forming a barrier layer on a silicon layer, and depositing a silicon oxide layer on the barrier layer. The formation of the barrier layer on the silicon layer minimizes parasitic oxidation of the underlying silicon layer and minimizes defects in the silicon layer.
Status:
Grant
Type:
Utility
Filling date:
4 May 2020
Issue date:
30 Nov 2021