Applied Materials, Inc.
Apparatus and Methods for Wafer Chucking on a Susceptor for ALD

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Abstract:

Described are apparatus and methods for processing a semiconductor wafer so that the wafer remains in place during processing. The wafer is subjected to a pressure differential between the top surface and bottom surface so that sufficient force prevents the wafer from moving during processing, the pressure differential generated by applying a decreased pressure to the back side of the wafer.

Status:
Application
Type:

Utility

Filling date:

16 Aug 2021

Issue date:

9 Dec 2021