Applied Materials, Inc.
CHAMBER CONFIGURATIONS AND PROCESSES FOR PARTICLE CONTROL
Last updated:
Abstract:
Exemplary processing methods may include forming a plasma of a cleaning precursor in a remote region of a semiconductor processing chamber. The methods may include flowing plasma effluents of the cleaning precursor into a processing region of the semiconductor processing chamber. The methods may include contacting a substrate support with the plasma effluents for a first period of time. The methods may include lowering the substrate support from a first position to a second position while continuing to flow plasma effluents of the cleaning precursor. The methods may include cleaning the processing region of the semiconductor processing chamber for a second period of time.
Status:
Application
Type:
Utility
Filling date:
15 Oct 2020
Issue date:
21 Apr 2022