Applied Materials, Inc.
CHAMBER CONFIGURATIONS AND PROCESSES FOR PARTICLE CONTROL

Last updated:

Abstract:

Exemplary processing methods may include forming a plasma of a cleaning precursor in a remote region of a semiconductor processing chamber. The methods may include flowing plasma effluents of the cleaning precursor into a processing region of the semiconductor processing chamber. The methods may include contacting a substrate support with the plasma effluents for a first period of time. The methods may include lowering the substrate support from a first position to a second position while continuing to flow plasma effluents of the cleaning precursor. The methods may include cleaning the processing region of the semiconductor processing chamber for a second period of time.

Status:
Application
Type:

Utility

Filling date:

15 Oct 2020

Issue date:

21 Apr 2022