Applied Materials, Inc.
THRESHOLD VOLTAGE MODULATION FOR GATE-ALL-AROUND FET ARCHITECTURE

Last updated:

Abstract:

A method of forming a gate stack structure includes forming a dipole metal layer on a high-.kappa. gate dielectric layer on a semiconductor structure formed on a substrate, annealing the dipole metal layer, and removing the dipole metal layer. The dipole metal layer comprises dopants in the high-.kappa. gate dielectric layer.

Status:
Application
Type:

Utility

Filling date:

17 Nov 2021

Issue date:

28 Jul 2022