Applied Materials, Inc.
Method and apparatus for deposition of low-k films
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Abstract:
Methods and apparatus for forming a conformal SiOC film on a surface are described. A SiCN film is formed on a substrate surface and exposed to a steam annealing process to decrease the nitrogen content, increase the oxygen content and leave the carbon content about the same. The annealed film has one or more of the wet etch rate or dielectric constant of the film.
Status:
Grant
Type:
Utility
Filling date:
11 Sep 2019
Issue date:
23 Mar 2021