Applied Materials, Inc.
Methods of forming self-aligned vias and air gaps
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Abstract:
A first metallization layer comprises a set of first conductive lines that extend along a first direction on a first dielectric layer on a substrate. Pillars are formed on recessed first dielectric layers and a second dielectric layer covers the pillars. A dual damascene etch provides a contact hole through the second dielectric layer and an etch removes the pillars to form air gaps.
Status:
Grant
Type:
Utility
Filling date:
25 Jul 2019
Issue date:
17 Nov 2020