Applied Materials, Inc.
TREATMENTS TO ENHANCE MATERIAL STRUCTURES
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Abstract:
A method of forming a high-K dielectric cap layer on a semiconductor structure formed on a substrate includes depositing the high-K dielectric cap layer on the semiconductor structure, depositing a sacrificial silicon cap layer on the high-K dielectric cap layer, performing a post cap anneal process to harden and densify the as-deposited high-K dielectric cap layer, and removing the sacrificial silicon cap layer.
Status:
Grant
Type:
Utility
Filling date:
18 Nov 2020
Issue date:
15 Apr 2021