Advanced Micro Devices, Inc.
STRESS INDICATORS ASSOCIATED WITH INSTANCES OF INPUT DATA FOR TRAINING NEURAL NETWORKS

Abstract:

An electronic device includes a computational functional block and a controller functional block. The controller functional block receives, along with an instance of input data for training a neural network to perform a specified task, a stress indicator associated with the instance of input data. The controller functional block selects, based on a value of the stress indicator, one or more operations to be performed when training the neural network. The controller functional block causes the computational functional block to perform the one or more operations when training the neural network.