Advanced Micro Devices, Inc.
METHODS AND DEVICES FOR TESTING MULTIPLE MEMORY CONFIGURATIONS

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Abstract:

Methods, devices, and systems for testing a number of combinations of memory in a computer system. A modular memory device is installed in a memory channel in communication with a processor. The modular memory device includes a number of memory storage devices. The number of memory storage devices include a number of pins. For each of a number of subsets of the number of memory storage devices, a subset of the number of memory storage devices is selected, each pin of a subset of the number of pins which do not correspond to the subset of the number of memory storage devices is configured with a termination impedance, and the subset of the number of memory storage devices is tested.

Status:
Application
Type:

Utility

Filling date:

24 Jan 2022

Issue date:

12 May 2022