Advanced Micro Devices, Inc.
Fine-grained speed binning in an accelerated processing device

Abstract:

A technique for fine-granularity speed binning for a processing device is provided. The processing device includes a plurality of clock domains, each of which may be clocked with independent clock signals. The clock frequency at which a particular clock domain may operate is determined based on the longest propagation delay between clocked elements in that particular clock domain. The processing device includes measurement circuits for each clock domain that measure such propagation delay. The measurement circuits are replica propagation delay paths of actual circuit elements within each particular clock domain. A speed bin for each clock domain is determined based on the propagation delay measured for the measurement circuits for a particular clock domain. Specifically, a speed bin is chosen that is associated with the fastest clock speed whose clock period is longer than the slowest propagation delay measured for the measurement circuit for the clock domain.