The Boeing Company
Differential capacitive probe for measuring contact resistance

Abstract:

A differential capacitive probe for measuring contact resistance, the differential capacitive probe including a frame, an end effector extending from the frame, a first capacitive pad coupled to the frame so as to at least partially circumscribe the end effector, and a second capacitive pad coupled to the frame so as to be radially spaced, relative to the end effector, from the first capacitive pad and to at least partially circumscribe the end effector, wherein a contact surface area of the first capacitive pad is substantially the same as another contact surface of the second capacitive pad.