Alibaba Group Holding Limited
System and method for compacting test data in many-core processors

Abstract:

A method for testing a many-core processor comprises grouping a plurality of cores in the processor into a plurality of super cores, wherein each super core comprises one or more scan chains that propagate through a respective super core. Further, the method comprises grouping the plurality of super cores into a plurality of clusters. The method also comprises comparing one or more scan chain outputs of respective super cores in each cluster using a network of XOR and OR gates to generate a single bit fault signature for each scan chain in a respective cluster and compacting the single bit fault signatures for each scan chain using a hybrid of spatial and temporal compactors to generate a single bit fault signature for each cluster. The method also comprises method of using a cost function to obtain hierarchical parameters to achieve optimized ATPG effort, area overhead and test time.