Cadence Design Systems, Inc.
In-system scan test of electronic devices

Abstract:

A system for testing of one or more electronic devices is disclosed. In an embodiment, a processor transmits one or more test vectors to the one or more electronic devices. The one or more test vectors are based upon configuration parameters of the processor and input-output parameters of the one or more electronic devices. The processor receives scan vectors from the one or more electronic devices in response to the plurality of test vectors. The processor verifies in-system behavior of the one or more electronic devices based upon comparing received scan vectors with expected scan vectors.