Cadence Design Systems, Inc.
Failing read count diagnostics for memory built-in self-test

Abstract:

Systems and methods disclosed herein provide for improved diagnostics for memory built-in self-test ("MBIST"). Embodiments provide for a sequence iterator unit including a diagnostics analysis unit that monitors and reports on the failing read count associated with the tested memory. Embodiments further provide for a bit fail map report that is generated based on the failing read count.