Lionheart Holdings
Wafer Scale Test Interface Unit: Low Loss and High Isolation Devices and Methods for High Speed and High Density Mixed Signal Interconnects and Contactors
Last updated:
Abstract:
Devices and methods for multilayer packages, antenna array feeds, test interface units, connectors, contactors, and large format substrates.
Status:
Application
Type:
Utility
Filling date:
30 May 2019
Issue date:
12 Sep 2019