General Electric Company
MULTI-TIERED SYSTEMS AND METHODS FOR COMPOSITION ANALYSIS

Abstract:

A diagnostic and inspection system is provided including a primary detection system, a secondary detection system, and at least one processor. The primary detection system is configured to acquire initial data of an object being analyzed. The secondary detection system includes at least one neutron source and at least one detector. The at least one detector is configured to acquire spectral emission data from the object generated responsive to neutrons provided by the at least one neutron source. The at least one processor is configured to acquire, from the primary detections system, the initial data from the object; determine a sub-portion of the object for further analysis using the initial data; direct at least one neutron beam from the at least one neutron source toward the sub-portion; acquire, from the secondary detector system, the spectral emission data from the object; and determine a presence of a substance using the spectral emission data.