General Electric Company
KPI SPOTLIGHT FOR MANUFACTURING PROCESS

Abstract:

The example embodiments are directed to a system and method for detecting operating patterns within a manufacturing process. In one example, the method may include receiving machine data from the manufacturing process and contextual information associated with the manufacturing process including a plurality of dynamic contextual attributes that change over time, determining KPIs for different permutations of the manufacturing process, where each KPI permutation is associated with a plurality of values for the plurality of dynamic contextual attributes, respectively, automatically detecting an operating pattern within the manufacturing process based on the determined KPIs and automatically detecting one or more values of the plurality of dynamic contextual attributes linked to the detected operating pattern, and outputting information about the detected operating pattern and the values of the plurality of dynamic contextual attributes linked to the detected operating pattern for display.