Gentex Corporation
SYSTEMS, DEVICES AND METHODS FOR MICRO-VIBRATION DATA EXTRACTION USING A TIME OF FLIGHT (ToF) IMAGING DEVICE

Abstract:

System and methods are provided for detecting vibrations of one or more object in a scene comprising at least one illumination source configured to project light in a structured light pattern on the scene; a Time-of-Flight (ToF) imaging device comprising: an illumination source configured to project modulated light into the scene, a ToF sensor, configured to capture a plurality of images comprising reflections of the modulated light, the structured light pattern from the one or more objects in the scene and ambient light images of one or more objects in the scene; and at least one processor configured to: extract depth data of said one or more objects by analyzing the plurality of images and analyze one or more changes in one or more speckle patterns of at least one of the reflections of said structured light pattern in at least some consecutive images of the plurality of images; and identify the vibrations of the at least one object based on said speckle pattern analysis and said depth data.