Honeywell International Inc.
Multi-patterned sputter traps and methods of making
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Abstract:
A sputtering chamber particle trap comprises first and second patterns formed on at least a portion of a surface of the particle trap. The first pattern includes one of: first indentations having a first depth and separated by first and second threads, and first ridges having a first height and separated by first and second grooves. The second pattern is formed on at least a portion of the first pattern and includes one of: second indentations having a second depth and separated by third and fourth threads, and second ridges having a second height and separated by third and fourth grooves. A method of forming a particle trap on a sputtering chamber component is also disclosed.
Status:
Grant
Type:
Utility
Filling date:
2 Oct 2018
Issue date:
23 Nov 2021