Honeywell International Inc.
PARTICLE SENSOR SAMPLE AREA QUALIFICATION WITHOUT A PHYSICAL SLIT

Abstract:

A system comprises a particle sensor unit in communication with a processor. The sensor unit comprises a source that transmits light into an interrogation region; receive optics that collect scattered light from particles in the interrogation region; and an optical detector that receives the collected light from the receive optics. The detector comprises a sample area including one or more sampling pixels, and an edge region including one or more edge pixels. The processor analyzes intensity data from the detector by a method comprising: combining all intensity data from the sampling pixels; adding the combined intensity data to a data set; determining whether to accept overlap intensity data that corresponds to an overlap between the sampling pixels and the edge pixels; adding the overlap intensity data to the data set if accepted; discarding the overlap intensity data if not accepted; and discarding all non-overlapping intensity data from the edge pixels.