Honeywell International Inc.
EVENT INPUT DEVICE TESTING

Abstract:

Devices, systems, and methods for event input device testing are described herein. In some examples, one or more embodiments include a controller comprising a memory and a processor to execute instructions stored in the memory to cause a first event input device of a group of event input devices to perform an automated test process, and determine whether a second event input device of the group of event input devices has detected a hazard event while the first event input device is performing the automated test process.