International Business Machines Corporation
EMULATION LATCH TO CAPTURE STATE

Abstract:

In an approach to simulating an electronic device, a copy of a design under test is created. A delayed buffer for the copy is created, where the inputs to the design under test are stored in the delayed buffer. A test program is run on the design under test and the copy, where the test program running on the copy is delayed in time by the delayed buffer. Responsive to determining that an event has occurred on the design under test, the test program on the copy is halted. The cause of the event is determined by using the inputs stored in the delayed buffer to scan the copy.