International Business Machines Corporation
Contact-first field-effect transistors
Last updated:
Abstract:
A method for forming a device structure provides for forming a fin of a semiconductor material. A first contact is formed on the fin. A second contact is formed on the fin and spaced along a length of the fin from the first contact. A self-aligned gate electrode is formed on the fin that is positioned along the length of the fin between the first contact and the second contact.
Status:
Grant
Type:
Utility
Filling date:
31 Oct 2019
Issue date:
24 Aug 2021