International Business Machines Corporation
Contact-first field-effect transistors

Last updated:

Abstract:

A method for forming a device structure provides for forming a fin of a semiconductor material. A first contact is formed on the fin. A second contact is formed on the fin and spaced along a length of the fin from the first contact. A self-aligned gate electrode is formed on the fin that is positioned along the length of the fin between the first contact and the second contact.

Status:
Grant
Type:

Utility

Filling date:

31 Oct 2019

Issue date:

24 Aug 2021