International Business Machines Corporation
LANDING PAD IN INTERCONNECT AND MEMORY STACKS: STRUCTURE AND FORMATION OF THE SAME

Last updated:

Abstract:

A conductive landing pad structure is formed utilizing a selective deposition process on a surface of an electrically conductive structure that is embedded in a first dielectric material layer. The conductive landing pad structure is located on an entirety of a surface of the electrically conductive structure and does not extend onto the first dielectric material layer. A conductive metal-containing structure is formed on a physically exposed surface of the conductive landing pad structure. During the formation of the conductive metal-containing structure which includes ion beam etching and/or a wet chemical etch, no conductive landing pad material particles re-deposit on the sidewalls of the conductive metal-containing structure.

Status:
Application
Type:

Utility

Filling date:

27 Apr 2021

Issue date:

12 Aug 2021