International Business Machines Corporation
VIA FORMATION WITH ROBUST HARDMASK REMOVAL
Last updated:
Abstract:
A semiconductor device includes a base structure including a first interlayer dielectric (ILD) layer and a contact including a conductive liner disposed along a conductive core, a conductive plug disposed on the conductive liner between the conductive core and the first ILD layer to a height of the base structure, and a metallization level including a conductive line and a self-aligned via underneath the conductive line disposed on the contact and the conductive plug. The conductive plug protects underlying material and increases connectivity between the self-aligned via and the contact that was reduced due to misalignment.
Status:
Application
Type:
Utility
Filling date:
3 Apr 2020
Issue date:
7 Oct 2021