International Business Machines Corporation
VIA FORMATION WITH ROBUST HARDMASK REMOVAL

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Abstract:

A semiconductor device includes a base structure including a first interlayer dielectric (ILD) layer and a contact including a conductive liner disposed along a conductive core, a conductive plug disposed on the conductive liner between the conductive core and the first ILD layer to a height of the base structure, and a metallization level including a conductive line and a self-aligned via underneath the conductive line disposed on the contact and the conductive plug. The conductive plug protects underlying material and increases connectivity between the self-aligned via and the contact that was reduced due to misalignment.

Status:
Application
Type:

Utility

Filling date:

3 Apr 2020

Issue date:

7 Oct 2021