International Business Machines Corporation
Formation of inner spacer on nanosheet MOSFET

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Abstract:

A method of forming a field effect transistor (FET) includes performing an oxidation on a nanosheet structure having alternating sheets of silicon and silicon germanium. An oxide etch is performed to remove portions of the sheets of silicon germanium. Other embodiments are also described herein.

Status:
Grant
Type:

Utility

Filling date:

23 Apr 2018

Issue date:

26 Oct 2021