International Business Machines Corporation
In situ probing of a discrete time analog circuit

Abstract:

Devices, systems, and methods that can facilitate in situ probing of a discrete time circuit components are provided. According to an embodiment, a device can comprise a hold circuit that can generate a sampled signal at a holding stage. The device can further comprise an in situ probe device that can be coupled to the hold circuit that can measure one or more operating voltage values at the holding stage based on the sampled signal.