International Business Machines Corporation
Barrier-less prefilled via formation
Last updated:
Abstract:
A method for fabricating a semiconductor device includes forming one or more layers including at least one of a liner and a barrier along surfaces of a first interlevel dielectric (ILD) layer within a trench, after forming the one or more liners, performing a via etch to form a via opening exposing a first conductive line corresponding to a first metallization level, and forming, within the via opening and on the first conductive line, a barrier-less prefilled via including first conductive material.
Status:
Grant
Type:
Utility
Filling date:
16 Jan 2020
Issue date:
19 Oct 2021