International Business Machines Corporation
Scrub management in storage class memory

Abstract:

A method and system for collecting diagnostic data from a storage class memory chip is disclosed. The method includes performing a scrub process on at least a portion of the storage class memory by: removing the portion of the storage class memory from use, wherein the portion comprises a plurality of memory locations, executing a first write operation to write a first pattern on each of the plurality of memory locations, executing a first read operation to obtain a first set of data written on each of the plurality of memory locations, analyzing the first set of data written on each of the plurality of memory locations to determine the number of stuck-at faults in the portion, and updating one or more counters in an error rate table (ERT) to indicate the number of stuck-at faults.