International Business Machines Corporation
Interconnects with gouged vias

Last updated:

Abstract:

A method of fabricating a semiconductor device includes depositing a spacer material in a trench arranged in a dielectric layer. An end of the trench extends to a metal layer of an interconnect structure. A portion of the spacer material in contact with the metal layer is removed. A recess is formed in the metal layer at the end of the trench.

Status:
Grant
Type:

Utility

Filling date:

21 Jun 2019

Issue date:

16 Nov 2021