International Business Machines Corporation
Interconnects with gouged vias
Last updated:
Abstract:
A method of fabricating a semiconductor device includes depositing a spacer material in a trench arranged in a dielectric layer. An end of the trench extends to a metal layer of an interconnect structure. A portion of the spacer material in contact with the metal layer is removed. A recess is formed in the metal layer at the end of the trench.
Status:
Grant
Type:
Utility
Filling date:
21 Jun 2019
Issue date:
16 Nov 2021