International Business Machines Corporation
Noise impact on function (NIOF) reduction for integrated circuit design

Abstract:

Techniques for noise impact on function (NIOF) reduction for an integrated circuit (IC) design are described herein. An aspect includes receiving a list of victim nets in which NIOF failures are present in an IC design. Another aspect includes attempting NIOF correction in each victim net of the list of victim nets. Another aspect includes, based on a failure of a NIOF correction in at least one victim net of the list of victim nets, saving the at least one victim net to a wire promote/demote list. Another aspect includes updating the list of victim nets based on the NIOF correction. Another aspect includes, based on determining that the updated list of victim nets is empty, promoting or demoting the at least one victim net from the wire promote/demote list in the IC design.