International Business Machines Corporation
Self-aligned pattern formation for a semiconductor device
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Abstract:
A method of forming a self-aligned pattern of vias in a semiconductor device comprises forming a first layer of mandrels, then forming a second layer of mandrels orthogonal to the first layer of mandrels. The layout of the first and second layers of mandrels defines a pattern that can be used to create vias in a semiconductor material. Other embodiments are also described.
Status:
Grant
Type:
Utility
Filling date:
1 May 2018
Issue date:
18 Jan 2022