International Business Machines Corporation
Recognition for overlapped patterns

Abstract:

In an approach, data of a plurality of points is sampled in a target area, wherein the data of each point of the plurality of points comprises position information and a height value. A first area of a target area is determined, wherein the height value of each point of the plurality of points in the first area complies with a first range. A second area of the target area is determined, wherein the height value of each point of the plurality of points in the second area complies with a second range. A third area of the target area is determined, wherein the height value of each point of the plurality of points in the third area complies with a third range. A first pattern is generated, wherein the first pattern is a combination of the first area and the third area.