International Business Machines Corporation
Conductive Oxide Diffusion Barrier for Laser Crystallization

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Abstract:

A cross-point memory semiconductor structure and a method of creating the same are provided. There is a first electrode layer on top of the substrate. A conductive oxide diffusion barrier layer is on top of the first electrode. A polycrystalline silicon diode is on top of the conductive oxide diffusion barrier. A phase change material (PCM) layer is on top of the polycrystalline silicon diode. A second electrode is on top of the PCM layer.

Status:
Application
Type:

Utility

Filling date:

17 Dec 2019

Issue date:

17 Jun 2021